Abbildende Ellipsometrie mit Lichtwegumkehrung f�r die optische Charakterisierung von gekr�mmten Oberfl�chen
Material type:![Text](/opac-tmpl/lib/famfamfam/BK.png)
- text
- computer
- online resource
- KSP/1000158762
Item type | Home library | Collection | Call number | Materials specified | Status | Date due | Barcode | |
---|---|---|---|---|---|---|---|---|
![]() |
OPJGU Sonepat- Campus | E-Books Open Access | Available |
Open Access Unrestricted online access star
Ellipsometry is a measuring method for surface characterization and thin-film measurement of flat surfaces using polarized light. However, a new measuring principle based on return-path ellipsometry and retroreflection enables the detection of free-form surfaces. This new measurement principle and related questions regarding the measurement function, evaluation algorithms and ambiguities as well as degrees of freedom of the solution set are examined in this work.
Creative Commons https://creativecommons.org/licenses/by/4.0/ cc
https://creativecommons.org/licenses/by/4.0/
German
There are no comments on this title.