MARC details
| 000 -LEADER |
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| fixed length control field |
02269namaa2200385uu 4500 |
| 001 - CONTROL NUMBER |
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| control field |
oapen64057 |
| 003 - CONTROL NUMBER IDENTIFIER |
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| control field |
oapen |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
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| control field |
20231221130911.0 |
| 006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS--GENERAL INFORMATION |
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| fixed length control field |
m o d |
| 007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION |
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| fixed length control field |
cr|mn|---annan |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
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| fixed length control field |
230724s2023 xx |||||o ||| 0|ger d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| International Standard Book Number |
KSP/1000158762 |
| 024 7# - OTHER STANDARD IDENTIFIER |
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| Standard number or code |
10.5445/KSP/1000158762 |
| Source of number or code |
doi |
| 040 ## - CATALOGING SOURCE |
|---|
| Original cataloging agency |
oapen |
| Transcribing agency |
oapen |
| 041 0# - LANGUAGE CODE |
|---|
| Language code of text/sound track or separate title |
ger |
| 042 ## - AUTHENTICATION CODE |
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| Authentication code |
dc |
| 072 #7 - SUBJECT CATEGORY CODE |
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| Subject category code |
UYAM |
| Source |
bicssc |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Negara, Christian Emanuel |
| Relator code |
auth |
| 9 (RLIN) |
1657724 |
| 245 10 - TITLE STATEMENT |
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| Title |
Abbildende Ellipsometrie mit Lichtwegumkehrung f�r die optische Charakterisierung von gekr�mmten Oberfl�chen |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
|---|
| Name of publisher, distributor, etc |
KIT Scientific Publishing |
| Date of publication, distribution, etc |
2023 |
| 300 ## - PHYSICAL DESCRIPTION |
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| Extent |
1 electronic resource (324 p.) |
| 336 ## - |
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| -- |
text |
| -- |
txt |
| -- |
rdacontent |
| 337 ## - |
|---|
| -- |
computer |
| -- |
c |
| -- |
rdamedia |
| 338 ## - |
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| -- |
online resource |
| -- |
cr |
| -- |
rdacarrier |
| 490 1# - SERIES STATEMENT |
|---|
| Series statement |
Schriftenreihe Automatische Sichtpr�fung und Bildverarbeitung |
| Volume number/sequential designation |
6 |
| 506 0# - RESTRICTIONS ON ACCESS NOTE |
|---|
| Terms governing access |
Open Access |
| Standardized terminology for access restriction |
Unrestricted online access |
| Source of term |
star |
| 520 ## - SUMMARY, ETC. |
|---|
| Summary, etc |
Ellipsometry is a measuring method for surface characterization and thin-film measurement of flat surfaces using polarized light. However, a new measuring principle based on return-path ellipsometry and retroreflection enables the detection of free-form surfaces. This new measurement principle and related questions regarding the measurement function, evaluation algorithms and ambiguities as well as degrees of freedom of the solution set are examined in this work. |
| 540 ## - TERMS GOVERNING USE AND REPRODUCTION NOTE |
|---|
| Terms governing use and reproduction |
Creative Commons |
| -- |
https://creativecommons.org/licenses/by/4.0/ |
| -- |
cc |
| Uniform Resource Identifier |
<a href="https://creativecommons.org/licenses/by/4.0/">https://creativecommons.org/licenses/by/4.0/</a> |
| 546 ## - LANGUAGE NOTE |
|---|
| Language note |
German |
| 650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Maths for computer scientists |
| Source of heading or term |
bicssc |
| 9 (RLIN) |
1561751 |
| 653 ## - INDEX TERM--UNCONTROLLED |
|---|
| Uncontrolled term |
imaging; retroreflection; curved surface; ellipsometry; bildgebend; Retroreflexion; gekr�mmte Oberfl�che; Ellipsometrie; metrology; Messtechnik |
| 793 0# - |
|---|
| -- |
OAPEN Library. |
| 856 40 - ELECTRONIC LOCATION AND ACCESS |
|---|
| Uniform Resource Identifier |
<a href="https://library.oapen.org/bitstream/id/fd610b13-1e13-4eda-b772-fed86a0eecc3/abbildende-ellipsometrie-mit-lichtwegumkehrung-fur-die-optische-charakterisierung-von-gekrummten-oberflachen.pdf">https://library.oapen.org/bitstream/id/fd610b13-1e13-4eda-b772-fed86a0eecc3/abbildende-ellipsometrie-mit-lichtwegumkehrung-fur-die-optische-charakterisierung-von-gekrummten-oberflachen.pdf</a> |
| -- |
0 |
| Public note |
Open Access: OAPEN Library, download the publication |
| 856 40 - ELECTRONIC LOCATION AND ACCESS |
|---|
| Uniform Resource Identifier |
<a href="https://library.oapen.org/handle/20.500.12657/64057">https://library.oapen.org/handle/20.500.12657/64057</a> |
| -- |
0 |
| Public note |
Open Access: OAPEN Library: description of the publication |
