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X-ray diffraction : structure, principles and applications / Kaimin Shih, editor. by Series: Materials science and technologies series
Material type: Text Text; Format: available online remote; Literary form: Not fiction
Publisher: New York : Nova Publishers, [2013]
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Structure analysis of advanced nanomaterials : nanoworld by high-resolution electron microscopy / Takeo Oku. by
Material type: Text Text; Format: available online remote; Literary form: Not fiction
Publisher: Berlin ; Boston : De Gruyter, [2014]
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A practical guide to transmission electron microscopy : fundamentals / Zhiping Luo. by Series: Materials characterization and analysis collection
Edition: First edition.
Material type: Text Text; Format: available online remote; Literary form: Not fiction ; Audience: Specialized;
Publisher: New York [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2016
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A practical guide to transmission electron microscopy. Volume II : Advanced microscopy / Zhiping Luo. by Series: Materials characterization and analysis collection
Edition: First edition.
Material type: Text Text; Format: available online remote; Literary form: Not fiction ; Audience: Specialized;
Publisher: New York [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2016
Other title:
  • Advanced microscopy
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Liquid cell electron microscopy / Frances M. Ross, IBM T.J. Watson Research Center. by Series: Advances in microscopy and microanalysis
Material type: Text Text; Format: available online remote; Literary form: Not fiction
Publisher: New York, NY : Cambridge University Press, 2017Copyright date: ©2017
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Introduction to conventional transmission electron microscopy / Marc De Graef. by
Material type: Text Text; Format: available online remote; Literary form: Not fiction
Publication details: Cambridge, U.K. ; New York, N.Y. : Cambridge University Press, 2003
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