Structure analysis of advanced nanomaterials : nanoworld by high-resolution electron microscopy / Takeo Oku.

By:

Oku, Takeo, 1965- [author.]

Material type: Text

TextPublisher: Berlin ; Boston : De Gruyter, [2014]Description: 1 online resource (viii, 168 pages .)Content type:

text

Media type:

computer

Carrier type:

online resource

ISBN:

3110305011
9783110305012
9781523100545
1523100540
9783110388046
3110388049

Subject(s): Genre/Form:

Additional physical formats: Print version:: No titleDDC classification:

502.8/25 23

LOC classification:

QH212.T7 O38 2014

Online resources:

Click here to access online

Contents:

Preface; Contents; Table for physical constants; 1 Introduction; 1.1 Characteristic of electron microscopy; 1.2 What information can be obtained by electron microscopy?; 1.3 Various types of electron microscopy; 2 Structure and principle of electron microscopes; 2.1 Structure of transmission electron microscope; 2.2 Observation mechanism of atoms by electrons; 2.3 Information from electron diffraction pattern; 2.4 High-resolution electron microscopy; 2.5 Scanning electron microscope; 2.6 Electron energy-loss spectroscopy; 2.7 Energy dispersive X-ray spectroscopy.

2.8 High-angle annular dark-field scanning TEM2.9 Electron holography and Lorentz microscopy; 2.10 Image simulation; 3 Practice of HREM; 3.1 Sample preparation; 3.2 Specimen preparation methods; 3.3 Structure analysis by X-ray diffraction; 3.4 TEM observation; 3.5 HREM observation; 3.6 Fourier filtering; 3.7 Resolution of HREM images; 3.8 Prevention of damage and contamination; 3.9 Taking images and reading data; 3.10 Mental attitude for TEM; 4 Characterization by HREM; 4.1 What information can be obtained?; 4.2 Direct atomic observation; 4.3 Crystallographic image processing.

Summary: <!Doctype html public ""-//w3c//dtd html 4.0 transitional//en""> <html><head> <meta http-equiv=content-type content=""text/html; charset=iso-8859-1""> <meta content=""mshtml 6.00.6000.17110"" name=generator></head> <body> High-resolution electron microscopy allows the imaging of the crystallographic structure of a sample at an atomic scale. It is a valuable tool to study nanoscale properties of crystalline materials such as superconductors, semiconductors, solar cells, zeolite materials, carbon nanomaterials or BN nanotubes. </body></html>

Item type:

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Home library	Collection	Call number	Materials specified	Status	Date due	Barcode
Electronic-Books	OPJGU Sonepat- Campus	E-Books EBSCO			Available

Includes bibliographical references and index.

Print version record.

<!Doctype html public ""-//w3c//dtd html 4.0 transitional//en""> <html><head> <meta http-equiv=content-type content=""text/html; charset=iso-8859-1""> <meta content=""mshtml 6.00.6000.17110"" name=generator></head> <body> High-resolution electron microscopy allows the imaging of the crystallographic structure of a sample at an atomic scale. It is a valuable tool to study nanoscale properties of crystalline materials such as superconductors, semiconductors, solar cells, zeolite materials, carbon nanomaterials or BN nanotubes. </body></html>

In English.

eBooks on EBSCOhost EBSCO eBook Subscription Academic Collection - Worldwide

There are no comments on this title.

to post a comment.