000 09145cam a2200889Ma 4500
001 ocn614489219
003 OCoLC
005 20220713030225.0
006 m o d
007 cr cn|||||||||
008 060907s2004 si a ob 101 0 eng d
010 _z 2006298164
040 _aCaPaEBR
_beng
_epn
_cADU
_dE7B
_dOCLCQ
_dCOCUF
_dN$T
_dYDXCP
_dIDEBK
_dDKDLA
_dOCLCQ
_dOCLCF
_dOCLCQ
_dOCLCO
_dSTF
_dOCL
_dOCLCO
_dOCLCQ
_dOCLCO
_dOCLCQ
_dAZK
_dAGLDB
_dMOR
_dPIFBR
_dOCLCQ
_dU3W
_dWRM
_dOCLCQ
_dVTS
_dINT
_dVT2
_dOCLCQ
_dWYU
_dOCLCQ
_dM8D
_dUKAHL
_dLEAUB
_dUKCRE
_dVLY
_dOCLCO
015 _aGBA481098.
_2bnb
015 _aGBA481098
_2bnb
016 7 _z013019492
_2Uk
016 7 _z013019492.
_2Uk
019 _a76965012
_a148771219
_a290543962
_a475446569
_a475614016
_a648234906
_a961665440
_a962579001
_a988418026
_a992027541
_a1037792120
_a1038659263
_a1055360374
_a1065021754
_a1081277185
_a1086422670
_a1153546101
_a1162362621
_a1228526922
_a1241877679
_a1290059023
_a1300475425
020 _a9812702644
_q(electronic bk.)
020 _a9789812702647
_q(electronic bk.)
020 _a9789812389046
020 _a9812389040
020 _z9812389040
020 _a1281898686
020 _a9781281898685
020 _a9786611898687
020 _a6611898689
029 1 _aAU@
_b000049163004
029 1 _aAU@
_b000051428580
029 1 _aDEBBG
_bBV043125092
029 1 _aDEBSZ
_b422239984
029 1 _aGBVCP
_b803165013
029 1 _aNZ1
_b14237482
029 1 _aYDXCP
_b2500449
035 _a(OCoLC)614489219
_z(OCoLC)76965012
_z(OCoLC)148771219
_z(OCoLC)290543962
_z(OCoLC)475446569
_z(OCoLC)475614016
_z(OCoLC)648234906
_z(OCoLC)961665440
_z(OCoLC)962579001
_z(OCoLC)988418026
_z(OCoLC)992027541
_z(OCoLC)1037792120
_z(OCoLC)1038659263
_z(OCoLC)1055360374
_z(OCoLC)1065021754
_z(OCoLC)1081277185
_z(OCoLC)1086422670
_z(OCoLC)1153546101
_z(OCoLC)1162362621
_z(OCoLC)1228526922
_z(OCoLC)1241877679
_z(OCoLC)1290059023
_z(OCoLC)1300475425
050 4 _aQA465
_b.A273 2004eb
072 7 _aTEC
_x022000
_2bisacsh
072 7 _aMAT
_x020000
_2bisacsh
082 0 4 _a530.8
_222
049 _aMAIN
245 0 0 _aAdvanced mathematical & computational tools in metrology VI /
_ceditors, P. Ciarlini [and others].
260 _aSingapore ;
_aRiver Edge, NJ :
_bWorld Scientific,
_c©2004.
300 _a1 online resource (x, 350 pages) :
_billustrations.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _adata file
_2rda
490 1 _aSeries on advances in mathematics for applied sciences ;
_vv. 66
504 _aIncludes bibliographical references and index.
588 0 _aPrint version record.
505 0 _aEstimation of precision and uncertainty of a calibration artefact for CMMs / S.D. Antunes and M.A.E Vicente -- Uncertainty in semi-qualitative testing / W. Bremser and W. Hässelbarth -- Processing the coherent anomalies on digitalized surfaces in wavelet domain / P. Ciarlini and M.L. Lo Cascio -- Least squares adjustment in the presence of discrepant data / M.G. Cox [and others] -- Harmonization of correlated calibration curves with an application to the analysis of natural gases / M.G. Cox [and others] -- Parametrized approximation estimators for mixed noise distributions / D.P. Jenkinson [and others] -- Algorithms for the calibration of laser-plane sensors on CMMs / C. Lartigue [and others] -- Some differences between the applied statistical approach for measurement uncertainty theory and the traditional approach in metrology and testing / C. Perruchet -- Metrology software for the expression of measurement results by direct calculation of probability distributions / G.B. Rossi, E. Crenna and M. Codda -- Feasibility study of using bootstrap to compute the uncertainty contribution from few repeated measurements / B.R.L. Siebert and P. Ciarlini -- Recursive and parallel algorithms for approximating surface data on a family of lines or curves / G. Allasia -- Process measurement impact on the verification uncertainty / J. Bachmann [and others] -- On the in-use uncertainty of an instrument / W. Bich and F. Pennecchi -- Automatic differentiation and its application in metrology / R. Boudjemaa [and others] -- Usage of non-central probability distributions for data analysis in metrology / A. Chunovkina -- Implementation of a general least squares method in mass measurements / J. Hald and L. Nielsen -- The GUM tree design pattern for uncertainty software / B.D. Hall -- Statistical hypotheses testing for phase transition identification in cryogenic thermometry / D. Ichim, I. Peroni and F. Sparasci -- The impact of entropy optimization principles on the probability assignment to the measurement uncertainty / G. Iuculano, A. Zanobini and G. Pellegrini -- Stochastic processes for modelling and evaluating atomic clock behaviour / G. Panfilo, P. Tavella and C. Zucca.
505 8 _aCompound-modelling of metrological data series / F. Pavese -- Homotopic solution of EW-TLS problems / M.L. Rastello and A. Premoli -- Pooled data distributions: graphical and statistical tools for examining comparison reference values / A.G. Steele, K.D. Hill and R.J. Douglas -- Numerical uncertainty evaluation for complex-valued quantities: a case example / L. Callegaro, F Pennecchi and W. Bich -- Bayesian approach to quantum state tomography / S. Castelletto [and others] -- Simulation of charge transfer in a tunnel junction: approaching the sub-e scale / G.E. D'Errico -- Validation of calibration methods -- a practical approach / E. Filipe -- Comparison of LS techniques for the linear approximation of data affected by heteroschedastic errors in both variables with uncertainty estimation / D. Ichim [and others] -- Noise correction for surface measurements / H. Haitjema and M.A.A. Morel -- Evaluation of uncertainty of standard platinum resistance thermometer at national laboratory level / M.J. Korczynski [and others] -- A new approach to the presentation of the result measurements in virtual instruments / M.J. Korczynski and A. Hetman -- A hybrid method for [symbol] approximation / D. Lei and J.C. Mason -- Interpolation equations for industrial platinum resistance thermometers / P. Marcarino, P.P.M. Steur and A. Merlone -- From the fixed points calibration to the certificate: a completely automated temperature laboratory / A. Merlone [and others] -- A new off-line gain stabilisation method applied to alpha-particle spectrometry / S. Pommé and G. Sibbens -- Development of software for ANOVA that can generate expressions of variance expectations / H. Tanaka, T. Kamoshita and K. Ehara -- Template matching in passive sonar recognition / J.L. Terry, D.A. Turner and J.C. Mason -- Fast computational alternative to Monte Carlo simulation of an output distribution / R.D. Willink and B.D. Hall -- Short course on uncertainty evaluation / M.G. Cox -- Software requirements in legal metrology: short course held adjacent to the conference / D. Richter.
520 _aThis volume collects refereed contributions based on the presentations made at the Sixth Workshop on Advanced Mathematical and Computational Tools in Metrology, held at the Istituto di Metrologia "G. Colonnetti" (IMGC), Torino, Italy, in September 2003. It provides a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources, and promotes collaboration in the context of EU programmes, EUROMET and EA projects, and MRA requirements. It contains articles by an important, worldwide group of metrologists and mathematicians involved in measurement science and, together with the five previous volumes in this series, constitutes an authoritative source for the mathematical, statistical and software tools necessary to modern metrology.
546 _aEnglish.
590 _aeBooks on EBSCOhost
_bEBSCO eBook Subscription Academic Collection - Worldwide
650 0 _aMeasurement
_vCongresses.
_9176472
650 0 _aPhysical measurements
_vCongresses.
_9176473
650 6 _aMesure
_vCongrès.
_9870020
650 6 _aMesures physiques
_vCongrès.
650 7 _aTECHNOLOGY & ENGINEERING
_xMeasurement.
_2bisacsh
_9870023
650 7 _aMATHEMATICS
_xMeasurement.
_2bisacsh
_9870022
650 7 _aMeasurement.
_2fast
_0(OCoLC)fst01715944
_9152571
650 7 _aPhysical measurements.
_2fast
_0(OCoLC)fst01062700
_971232
653 1 _aMetrology
655 0 _aElectronic books.
655 4 _aElectronic books.
655 7 _aConference papers and proceedings.
_2fast
_0(OCoLC)fst01423772
700 1 _aCiarlini, P.
_9176474
776 0 8 _iPrint version:
_tAdvanced mathematical & computational tools in metrology VI.
_dSingapore ; River Edge, NJ : World Scientific, ©2004
_w(DLC) 2006298164
830 0 _aSeries on advances in mathematics for applied sciences ;
_vv. 66.
856 4 0 _uhttps://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=174544
938 _aAskews and Holts Library Services
_bASKH
_nAH24683911
938 _aebrary
_bEBRY
_nebr10174114
938 _aEBSCOhost
_bEBSC
_n174544
938 _aYBP Library Services
_bYANK
_n2500449
994 _a92
_bINOPJ
999 _c2922059
_d2922059