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082 0 4 _a621.39/732
_222
049 _aMAIN
245 0 0 _aTerrestrial neutron-induced soft errors in advanced memory devices /
_cTakashi Nakamura [and others].
260 _aHackensack, NJ :
_bWorld Scientific,
_c©2008.
300 _a1 online resource (xxii, 343 pages) :
_billustrations (some color)
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
504 _aIncludes bibliographical references (pages 291-315) and index.
505 0 _aIntroduction -- Terrestrial neutron spectrometry and dosimetry -- Irradiation testing in the terrestrial field -- Neutron irradiation test facilities -- Review and discussion of experimental data -- Monte Carlo simulation methods -- Simulation results and their implications -- International standardization of the neutron test method -- Summary and challenges.
588 0 _aPrint version record.
520 _aThere are numerous elaborate and comprehensive textbooks and guidelines on stroke. However, busy clinicians are constantly bombarded with new knowledge for an infinite number of medical conditions. It becomes a challenge for them to tease out the important information that will help guide them through the care of the patient they have right before them. This handbook is thus conceptualized with both the busy clinician and the stroke patient needing urgent treatment in mind. By providing only essential information in a standard and user-friendly layout, it assists clinicians in making real-time decisions quickly and effectively with actual step-by-step guides on specific issues relevant to the care of stroke patients. The use of this practical handbook is instinctive with the topics arranged in chronological order, simulating the actual clinical scenario from a prehospital setting, consultation in the emergency room, admission to the hospital, to secondary prevention in the clinic. With contributions from over 30 stroke experts in Southeast Asia, this handbook is widely applicable in different medical settings and will certainly appeal to stroke specialists, general practitioners, nurses, paramedics, and medical students alike.
590 _aeBooks on EBSCOhost
_bEBSCO eBook Subscription Academic Collection - Worldwide
650 0 _aSoft errors (Computer science)
_91449042
650 0 _aSemiconductor storage devices.
_9290336
650 0 _aNeutron irradiation.
_9383789
650 0 _aRadiation dosimetry.
_9171519
650 0 _aNuclear physics.
_971183
650 6 _aErreurs temporaires (Informatique)
_91449043
650 6 _aOrdinateurs
_xMémoires à semi-conducteurs.
_91218180
650 6 _aNeutrons
_xIrradiation.
_91449044
650 6 _aDosimétrie.
_9986942
650 6 _aPhysique nucléaire.
_9868858
650 7 _adosimetry.
_2aat
_9986943
650 7 _anuclear physics.
_2aat
_971183
650 7 _aCOMPUTERS
_xMachine Theory.
_2bisacsh
_938226
650 7 _aCOMPUTERS
_xComputer Engineering.
_2bisacsh
_9890211
650 7 _aCOMPUTERS
_xHardware
_xGeneral.
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_938231
650 7 _aSoft errors (Computer science)
_2fast
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_91449042
650 7 _aNeutron irradiation.
_2fast
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_9383789
650 7 _aNuclear physics.
_2fast
_0(OCoLC)fst01040386
_971183
650 7 _aRadiation dosimetry.
_2fast
_0(OCoLC)fst01086926
_9171519
650 7 _aSemiconductor storage devices.
_2fast
_0(OCoLC)fst01112182
_9290336
655 0 _aElectronic book.
655 4 _aElectronic books.
700 1 _aNakamura, Takashi,
_d1939-
_9383790
776 0 8 _iPrint version:
_tTerrestrial neutron-induced soft errors in advanced memory devices.
_dHackensack, NJ : World Scientific, ©2008
_z9789812778819
_z9812778810
_w(DLC) 2008298667
_w(OCoLC)185032763
856 4 0 _uhttps://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=236119
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