000 | 06282cam a2200949Ma 4500 | ||
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001 | ocn560636099 | ||
003 | OCoLC | ||
005 | 20220713020203.0 | ||
006 | m o d | ||
007 | cr cn||||||||| | ||
008 | 071223s2008 njua ob 001 0 eng d | ||
040 |
_aMERUC _beng _epn _cMERUC _dCCO _dE7B _dOCLCQ _dQE2 _dN$T _dIDEBK _dOCLCQ _dM6U _dFVL _dOCLCQ _dOCLCF _dORE _dYDXCP _dOCL _dEBLCP _dDEBSZ _dCDX _dSTF _dOCLCQ _dCOCUF _dAGLDB _dMOR _dPIFPO _dZCU _dOTZ _dOCLCQ _dMERUC _dOCLCQ _dU3W _dWRM _dOCLCQ _dVTS _dNRAMU _dICG _dINT _dVT2 _dOCLCQ _dWYU _dTKN _dDKC _dAU@ _dOCLCQ _dM8D _dUKAHL _dOCLCQ _dK6U _dUKCRE _dOCLCO |
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020 |
_a9789812778826 _q(electronic bk.) |
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_a9812778829 _q(electronic bk.) |
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020 | _a1281930059 | ||
020 | _a9781281930057 | ||
020 | _z9789812778819 | ||
020 | _z9812778810 | ||
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050 | 4 |
_aTK7895.M4 _bT47 2008eb |
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_aCOM _x037000 _2bisacsh |
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_aMJN _2bicssc |
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082 | 0 | 4 |
_a621.39/732 _222 |
049 | _aMAIN | ||
245 | 0 | 0 |
_aTerrestrial neutron-induced soft errors in advanced memory devices / _cTakashi Nakamura [and others]. |
260 |
_aHackensack, NJ : _bWorld Scientific, _c©2008. |
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300 |
_a1 online resource (xxii, 343 pages) : _billustrations (some color) |
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336 |
_atext _btxt _2rdacontent |
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337 |
_acomputer _bc _2rdamedia |
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338 |
_aonline resource _bcr _2rdacarrier |
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504 | _aIncludes bibliographical references (pages 291-315) and index. | ||
505 | 0 | _aIntroduction -- Terrestrial neutron spectrometry and dosimetry -- Irradiation testing in the terrestrial field -- Neutron irradiation test facilities -- Review and discussion of experimental data -- Monte Carlo simulation methods -- Simulation results and their implications -- International standardization of the neutron test method -- Summary and challenges. | |
588 | 0 | _aPrint version record. | |
520 | _aThere are numerous elaborate and comprehensive textbooks and guidelines on stroke. However, busy clinicians are constantly bombarded with new knowledge for an infinite number of medical conditions. It becomes a challenge for them to tease out the important information that will help guide them through the care of the patient they have right before them. This handbook is thus conceptualized with both the busy clinician and the stroke patient needing urgent treatment in mind. By providing only essential information in a standard and user-friendly layout, it assists clinicians in making real-time decisions quickly and effectively with actual step-by-step guides on specific issues relevant to the care of stroke patients. The use of this practical handbook is instinctive with the topics arranged in chronological order, simulating the actual clinical scenario from a prehospital setting, consultation in the emergency room, admission to the hospital, to secondary prevention in the clinic. With contributions from over 30 stroke experts in Southeast Asia, this handbook is widely applicable in different medical settings and will certainly appeal to stroke specialists, general practitioners, nurses, paramedics, and medical students alike. | ||
590 |
_aeBooks on EBSCOhost _bEBSCO eBook Subscription Academic Collection - Worldwide |
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650 | 0 |
_aSoft errors (Computer science) _91449042 |
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650 | 0 |
_aSemiconductor storage devices. _9290336 |
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650 | 0 |
_aNeutron irradiation. _9383789 |
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650 | 0 |
_aRadiation dosimetry. _9171519 |
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650 | 0 |
_aNuclear physics. _971183 |
|
650 | 6 |
_aErreurs temporaires (Informatique) _91449043 |
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650 | 6 |
_aOrdinateurs _xMémoires à semi-conducteurs. _91218180 |
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650 | 6 |
_aNeutrons _xIrradiation. _91449044 |
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650 | 6 |
_aDosimétrie. _9986942 |
|
650 | 6 |
_aPhysique nucléaire. _9868858 |
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650 | 7 |
_adosimetry. _2aat _9986943 |
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650 | 7 |
_anuclear physics. _2aat _971183 |
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650 | 7 |
_aCOMPUTERS _xMachine Theory. _2bisacsh _938226 |
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650 | 7 |
_aCOMPUTERS _xComputer Engineering. _2bisacsh _9890211 |
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650 | 7 |
_aCOMPUTERS _xHardware _xGeneral. _2bisacsh _938231 |
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650 | 7 |
_aSoft errors (Computer science) _2fast _0(OCoLC)fst01911243 _91449042 |
|
650 | 7 |
_aNeutron irradiation. _2fast _0(OCoLC)fst01036631 _9383789 |
|
650 | 7 |
_aNuclear physics. _2fast _0(OCoLC)fst01040386 _971183 |
|
650 | 7 |
_aRadiation dosimetry. _2fast _0(OCoLC)fst01086926 _9171519 |
|
650 | 7 |
_aSemiconductor storage devices. _2fast _0(OCoLC)fst01112182 _9290336 |
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655 | 0 | _aElectronic book. | |
655 | 4 | _aElectronic books. | |
700 | 1 |
_aNakamura, Takashi, _d1939- _9383790 |
|
776 | 0 | 8 |
_iPrint version: _tTerrestrial neutron-induced soft errors in advanced memory devices. _dHackensack, NJ : World Scientific, ©2008 _z9789812778819 _z9812778810 _w(DLC) 2008298667 _w(OCoLC)185032763 |
856 | 4 | 0 | _uhttps://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=236119 |
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_aProQuest Ebook Central _bEBLB _nEBL1681740 |
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938 |
_aebrary _bEBRY _nebr10255560 |
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938 |
_aEBSCOhost _bEBSC _n236119 |
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_aProQuest MyiLibrary Digital eBook Collection _bIDEB _n193005 |
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