Epioptics 2000 : proceedings of the 19th course of the International School of Solid State Physics : Erice, Sicily, Italy, 19-25 July 2000 / editor, Antonio Cricenti.

"This special volume of World Scientific contains the Proceedings of the 6th Epioptics Workshop held in the Ettore Majorana Foundation and Centre for Scientific Culture, Erice, Sicily, from July 19 to 25, 2000. The Workshop was the 6th in the Epioptics series and the 19th of the International School of Solid State Physics"--Page v.

Includes bibliographical references.

This is the proceedings of a workshop which brought together researchers from universities and research institutes who work in the fields of (semiconductor) surface science, epitaxial growth, materials deposition and optical diagnostics relevant to (semiconductor) materials and structures of interest for present and anticipated (spin) electronic devices. The workshop assessed the capabilities of state-of-the-art optical techniques in elucidating the fundamental electronic and structural properties of semiconductor and metal surfaces, interfaces, thin layers, and layer structures, and examined the usefulness of these techniques for optimization of high quality multilayer samples through feedback control during materials growth and processing.

Preface; Optical Properties of Excitons in Semiconductor Quantum Wells and Microcavities; 1 Excitons in quantum wells; 2 Radiation-matter interaction in microcavities; 3 Acknowledgements; References; Polarizable Bond Model for Reflectance Anisotropy and Second Harmonic Generation for Si(100) Surfaces; 1 Introduction; 2 Theory; 3 Results; 4 Conclusions; References; Optical Properties of Semiconductor Surfaces; 1. Introduction; 2. Applications of sum rules to surface reflectivity; 3. SDR results for Ge(111)2x1 and Si(111)2x1 and discussion.

4. Reflectance Anisotropy Spectroscopy (RAS). Results and discussionReferences; Near-field Photoluminescence Spectra of Laser Active Point Defects in LiF Films; 1 Introduction; 2 Sample preparation; 3 Experimental; 4 Results and discussion; Conclusions; References; Measurements of Second-Order Optical Susceptibility in Crystalline and Porous Silicon; 1 Introduction; 2 Theory; 3 Experiment; 4 Results and analysis; References; Combination of Surface Characterising Technique and X-ray Spectroscopy to Detect the Interaction of an Dihydropyridine Drug with Red Blood Cells; 1. Introduction.

2. Methods3. Results and Discussion.; References; Giant Bilayer Hemoglobin from Earthworm Studied by X-ray Absorption Spectroscopy and Atomic Force Microscopy; 1. Introduction; 2. Methods; 3. Experiments and sample characterization; 4. Discussion; References; Is Reflectance Anisotropy Spectroscopy Useful to Investigate Langmuir-Blodgett Films?; 1. Introduction; 2. Experimental; 3. Results and discussion; 4. Conclusions; References; SNOM & Spectroscopy: A Technique Beyond the Diffraction Limit; 1. Introduction; 2. Theoretical models; 3. Experimental set-up; 4. Instrument description.

5. Experimental results6. Conclusions; References; Near-Field Photoluminescence Spectra of CsPbBr3 Nanocrystals in CsBr-PbBr2 Co-Evaporated Thin Films; 1. Introduction; 2. Experimental apparatus; 3. Results and discussion; References; Theory of Second Harmonic Generation at Semiconductor Surfaces; 1 Introduction; 2 Theory; 3 Results; 4 Conclusions; References; Optical Anisotropy of Clean and Oxidized GaAs(001)-4x2; 1. Introduction; 2. Experiment and Method; 3. Results and Discussion; References; Interaction of Homogeneous and Surface Waves with Metal Nanoparticles; 1 Introduction.

2 Experiments: sample and methods3 Theory; 4 Scattering by NPs; 5 Conclusion; 6 Acknowledgements; References; Differential Reflectivity and Angle Resolved Photoemission of PbS (100); 1. Introduction; 2. Experimental set-up; 3. Experimental Results; 4. Conclusions; References; Spectroscopic-Ellipsometrical Characterization of Photon-Surface-Plasmon Coupling in a Multilayer Diffraction Grating; 1. Introduction; 2. Fabrication and investigation of multilayer structures.; 3. Spectroscopic-ellipsometrical investigation of multilayer diffraction grating in SPR- region; 4. Conclusions.

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