X-ray scattering / Christopher M. Bauwens, editor.
Material type: TextSeries: Materials science and technologies seriesPublisher: New York : Nova Science Publishers, Inc., [2012]Description: 1 online resourceContent type:- text
- computer
- online resource
- 9781624175060
- 1624175066
- 621.36/73 22
- TA417.25
Item type | Home library | Collection | Call number | Materials specified | Status | Date due | Barcode | |
---|---|---|---|---|---|---|---|---|
Electronic-Books | OPJGU Sonepat- Campus | E-Books EBSCO | Available |
Includes bibliographical references and index.
GISAXS -- probe of buried interfaces in multi-layered thin films / P. Siffalovic, M. Jergel, and E. Majkova -- In situ, real-time synchrotron x-ray scattering / Bridget Ingham -- Applications of x-ray scattering in edible lipid systems / Cristián Huck-Iriart, Noé Javier Morales-Mendoza, Roberto Jorge Candal and María Lidia Herrera -- Small angle x-ray scattering analysis of nanomaterials for ultra large scale integrated circuits / T. K. S. Wong and T. K. Goh -- X-ray scattering of bacterial cell wall compounds and their neutralization / Michael Rappolt, Manfred Rössle, Yani Kaconis, Jörg Howe, Jörg Andrä, Thomas Gutsmann, and Klaus Brandenburg -- Decomposition of WAXS diffractograms of semicrystalline polymers by simulated annealing / Gopinath Subramanian and Rahmi Ozisik -- Depth profile analysis of surface layer structure using x-ray diffraction and x-ray reflectivity at small glancing angles of incidence / Yoshikazu Fujii -- SAXS/WAXS characterization of sol-gel derived nanomaterials / Gang Chen.
Description based on print version record.
English.
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