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X-ray scattering / Christopher M. Bauwens, editor.

Contributor(s): Material type: TextTextSeries: Materials science and technologies seriesPublisher: New York : Nova Science Publishers, Inc., [2012]Description: 1 online resourceContent type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9781624175060
  • 1624175066
Subject(s): Genre/Form: Additional physical formats: Print version:: X-ray scatteringDDC classification:
  • 621.36/73 22
LOC classification:
  • TA417.25
Online resources:
Contents:
GISAXS -- probe of buried interfaces in multi-layered thin films / P. Siffalovic, M. Jergel, and E. Majkova -- In situ, real-time synchrotron x-ray scattering / Bridget Ingham -- Applications of x-ray scattering in edible lipid systems / Cristián Huck-Iriart, Noé Javier Morales-Mendoza, Roberto Jorge Candal and María Lidia Herrera -- Small angle x-ray scattering analysis of nanomaterials for ultra large scale integrated circuits / T. K. S. Wong and T. K. Goh -- X-ray scattering of bacterial cell wall compounds and their neutralization / Michael Rappolt, Manfred Rössle, Yani Kaconis, Jörg Howe, Jörg Andrä, Thomas Gutsmann, and Klaus Brandenburg -- Decomposition of WAXS diffractograms of semicrystalline polymers by simulated annealing / Gopinath Subramanian and Rahmi Ozisik -- Depth profile analysis of surface layer structure using x-ray diffraction and x-ray reflectivity at small glancing angles of incidence / Yoshikazu Fujii -- SAXS/WAXS characterization of sol-gel derived nanomaterials / Gang Chen.
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Includes bibliographical references and index.

GISAXS -- probe of buried interfaces in multi-layered thin films / P. Siffalovic, M. Jergel, and E. Majkova -- In situ, real-time synchrotron x-ray scattering / Bridget Ingham -- Applications of x-ray scattering in edible lipid systems / Cristián Huck-Iriart, Noé Javier Morales-Mendoza, Roberto Jorge Candal and María Lidia Herrera -- Small angle x-ray scattering analysis of nanomaterials for ultra large scale integrated circuits / T. K. S. Wong and T. K. Goh -- X-ray scattering of bacterial cell wall compounds and their neutralization / Michael Rappolt, Manfred Rössle, Yani Kaconis, Jörg Howe, Jörg Andrä, Thomas Gutsmann, and Klaus Brandenburg -- Decomposition of WAXS diffractograms of semicrystalline polymers by simulated annealing / Gopinath Subramanian and Rahmi Ozisik -- Depth profile analysis of surface layer structure using x-ray diffraction and x-ray reflectivity at small glancing angles of incidence / Yoshikazu Fujii -- SAXS/WAXS characterization of sol-gel derived nanomaterials / Gang Chen.

Description based on print version record.

English.

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