High-resolution electron microscopy / John C.H. Spence, Department of Physics and Astronomy, Arizona State University/LBNL, California.

By:

Spence, John C. H [author.]

Material type: Text

TextPublisher: Oxford : Oxford University Press, 2013Edition: Fourth editionDescription: 1 online resource (xix, 406 pages) : illustrations (some color)Content type:

text

Media type:

computer

Carrier type:

online resource

ISBN:

9780191508400
0191508403
9780191749322
019174932X
9780199668632
0199668639

Uniform titles:

Experimental high-resolution electron microscopy

Subject(s):

Genre/Form:

Additional physical formats: Print version:: High-resolution electron microscopy.DDC classification:

502.825 22

LOC classification:

QH212.T7 S68 2013

Online resources:

Click here to access online

Summary: In the 4th edition, applications sections have been updated including the semiconductor industry, superconductor research solid state chemistry and nanoscience, and metallurgy mineralogy, condensed matter physics, materials science and material on cryo-electron microscopy for structural biology. New or expanded sections have been added on electron holography aberration correction, field-emission guns, imaging filters super-resolution methods, Ptychography, Ronchigrams, tomography image quantification and simulation, and more.Other editions: Revision of:: Spence, John C.H. Experimental high-resolution electron microscopy.

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Item type	Home library	Collection	Call number	Materials specified	Status	Date due	Barcode
Electronic-Books	OPJGU Sonepat- Campus	E-Books EBSCO			Available

Includes bibliographical references and index.

Print version record.

In the 4th edition, applications sections have been updated including the semiconductor industry, superconductor research solid state chemistry and nanoscience, and metallurgy mineralogy, condensed matter physics, materials science and material on cryo-electron microscopy for structural biology. New or expanded sections have been added on electron holography aberration correction, field-emission guns, imaging filters super-resolution methods, Ptychography, Ronchigrams, tomography image quantification and simulation, and more.

English.

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