Introduction to scanning tunneling microscopy / C. Julian Chen.
Material type:
TextSeries: Oxford series in optical and imaging sciences ; 4.Publication details: New York : Oxford University Press, 1993.Description: 1 online resource (xxii, 412 pages, 31 pages of plates) : illustrationsContent type: - text
- computer
- online resource
- 9780198023562
- 0198023561
- 502/.8/2 20
- QH212.S35 C44 1993
- 33.61
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Includes bibliographical references (pages 383-404) and index.
1. Overview. 1.1. The scanning tunneling microscope in a nutshell. 1.2. Tunneling: an elementary model. 1.3. Probing electronic structure at an atomic scale. 1.4. Spatially resolved tunneling spectroscopy. 1.5. Lateral resolution: Early theories. 1.6. Origin of atomic resolution in STM. 1.7. Tip-sample interaction effects. 1.8. Historical remarks -- 2. Atom-scale tunneling. 2.2. The perturbation approach. 2.3. The image force. 2.4. The Square-barrier problem. 2.5. The modified Bardeen approach. 2.6. Effect of image force on tunneling -- 3. Tunneling matrix elements. 3.2. Tip wavefunctions. 3.3. Green's function and tip wavefunctions. 3.4. The derivative rule: individual cases. 3.5. The derivative rule: general case. 3.6. An intuitive interpretation -- 4. Wavefunctions at surfaces. 4.1. Types of surface wavefunctions. 4.2. The jellium model. 4.3. Concept of surface states. 4.4. Field emission spectroscopy. 4.5. Photoemission studies. 4.6. Atom-beam diffraction.
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