Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space
Material type:![Article](/opac-tmpl/lib/famfamfam/AR.png)
- KSP/1000035134
- 9783731500384
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OPJGU Sonepat- Campus | E-Books Open Access | Available |
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Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations.
Creative Commons https://creativecommons.org/licenses/by-nc-nd/4.0/ cc https://creativecommons.org/licenses/by-nc-nd/4.0/
English
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