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Photographic sensitivity : theory and mechanisms / Tadaaki Tani. by Series: Oxford series in optical and imaging sciences ; 8.
Material type: Text Text; Format: available online remote; Literary form: Not fiction
Publication details: New York : Oxford University Press, 1995
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Scanning force microscopy : with applications to electric, magnetic, and atomic forces / Dror Sarid. by Series: Oxford series in optical and imaging sciences ; 5.
Edition: Rev. ed.
Material type: Text Text; Format: available online remote; Literary form: Not fiction
Publication details: New York : Oxford University Press, 1994
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Monte Carlo modeling for electron microscopy and microanalysis / David C. Joy. by Series: Oxford series in optical and imaging sciences ; 9.
Material type: Text Text; Format: available online remote; Literary form: Not fiction
Publication details: New York : Oxford University Press, 1995
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Introduction to scanning tunneling microscopy / C. Julian Chen. by Series: Oxford series in optical and imaging sciences ; 4.
Material type: Text Text; Format: available online remote; Literary form: Not fiction
Publication details: New York : Oxford University Press, 1993
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