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Pulsed neural networks / edited by Wolfgang Maass, Christopher M. Bishop. by Series: Bradford book
Material type: Text Text; Format: available online remote; Literary form: Not fiction
Copyright date: ©1999
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Availability: Items available for loan: OPJGU Sonepat- Campus (1).
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VLSI test principles and architectures : design for testability / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen. by Series: Morgan Kaufmann series in systems on silicon
Material type: Text Text; Format: available online remote; Literary form: Not fiction
Publication details: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, ©2006
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Real-time digital signal processing based on the TMS320C6000 / by Nasser Kehtarnavaz ; with laboratory contributions by Namjin Kim. by
Material type: Text Text; Format: available online remote; Literary form: Not fiction
Publication details: Amsterdam ; Boston : Elsevier : Newnes, ©2005
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System-on-chip test architectures : nanometer design for testability / edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba. by Series: Morgan Kaufmann series in systems on silicon
Material type: Text Text; Format: available online remote; Literary form: Not fiction
Publication details: Amsterdam ; Boston : Morgan Kaufmann Publishers, ©2008
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