Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra / by Igor F. Mikhailov, Alexey A. Baturin, and Anton I. Mikhailov.

By:

Mikhailov, Igor F

Contributor(s):

Material type: Text

text

Media type:

computer

Carrier type:

online resource

ISBN:

1527543897
9781527543898

Subject(s): Genre/Form:

Electronic books.

Additional physical formats: Print version:: Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra.DDC classification:

543.56 23

LOC classification:

QD96.F56 M55 2020

Online resources:

Click here to access online

Summary: This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scattering, and diffraction reflections. It considers fluorescence, scattered, and diffracted radiations within the common problem of analytical spectrum formation. The complex methods for analyzing the material composition by joint spectra of fluorescence, Compton scattering and diffraction proposed here allow for a widening of the area of the application of X-ray methods. The book will be useful for specialists in the field of solid state physi.

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Item type	Home library	Collection	Call number	Materials specified	Status	Date due	Barcode
Electronic-Books	OPJGU Sonepat- Campus	E-Books EBSCO			Available

This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scattering, and diffraction reflections. It considers fluorescence, scattered, and diffracted radiations within the common problem of analytical spectrum formation. The complex methods for analyzing the material composition by joint spectra of fluorescence, Compton scattering and diffraction proposed here allow for a widening of the area of the application of X-ray methods. The book will be useful for specialists in the field of solid state physi.