TY  - BOOK
AU  - Negara,Christian Emanuel
TI  - Abbildende Ellipsometrie mit Lichtwegumkehrung f�r die optische Charakterisierung von gekr�mmten Oberfl�chen
T2  - Schriftenreihe Automatische Sichtpr�fung und Bildverarbeitung
SN  - KSP/1000158762
PY  - 2023///
PB  - KIT Scientific Publishing
KW  - Maths for computer scientists
KW  - bicssc
KW  - imaging; retroreflection; curved surface; ellipsometry; bildgebend; Retroreflexion; gekr�mmte Oberfl�che; Ellipsometrie; metrology; Messtechnik
N1  - Open Access
N2  - Ellipsometry is a measuring method for surface characterization and thin-film measurement of flat surfaces using polarized light. However, a new measuring principle based on return-path ellipsometry and retroreflection enables the detection of free-form surfaces. This new measurement principle and related questions regarding the measurement function, evaluation algorithms and ambiguities as well as degrees of freedom of the solution set are examined in this work
UR  - https://library.oapen.org/bitstream/id/fd610b13-1e13-4eda-b772-fed86a0eecc3/abbildende-ellipsometrie-mit-lichtwegumkehrung-fur-die-optische-charakterisierung-von-gekrummten-oberflachen.pdf
UR  - https://library.oapen.org/handle/20.500.12657/64057
ER  -