TY  - BOOK
AU  - Giri,D.V.
AU  - Hoad,Richard
AU  - Sabath,Frank
TI  - High-power radio frequency effects on electronic systems
T2  - Artech House electromagnetics series
SN  - 9781630815899
AV  - TK7867.2 .G57 2020
U1  - 621.382/24 23
PY  - 2020///]
CY  - Norwood, MA
PB  - Artech House
KW  - Electromagnetic compatibility
KW  - Compatibilité électromagnétique
KW  - fast
KW  - Electronic books
N1  - Includes bibliographical references and index; High-Power Electromagnetic Effects on Electronic Systems -- Contents -- Foreword -- Acknowledgments -- 1 Introduction -- 1.1 Reliance on Electronics -- 1.2 HPEM Environment Overview -- 1.3 HPEM Effects Overview -- 1.4 A Brief History of EM Interference and Effects -- 1.5 A Systems-of-Systems Hierarchy -- 1.5.1 Device -- 1.5.2 Circuit -- 1.5.3 Equipment -- 1.5.4 System -- 1.5.5 Network -- 1.5.6 Infrastructure -- 1.6 Summary -- References -- 2 HPEM Environments -- 2.1 Introduction -- 2.2 Lightning -- 2.2.1 Overview -- 2.2.2 Lightning-Radiated Environment -- 2.3 Nuclear EM Pulse; 2.3.1 HEMP-Radiated Environment -- 2.3.2 HEMP-Conducted Environment -- 2.3.3 Open-Source Accounts of HEMP Disturbances -- 2.3.4 HEMP Environment Summary -- 2.4 High-Power RF Directed Energy Environments -- 2.4.1 The Status of HPRF DE Systems Today -- 2.5 Intentional EM Interference Environments -- 2.5.1 IEMI Technical Capability Groups -- 2.5.2 IEMI Environment Summary -- 2.5.3 Open-Source Accounts of HPRF DE and IEMI Action -- 2.6 Classification of HPRF DE and IEMI Environments -- 2.6.1 Hypoband -- 2.6.2 Mesoband -- 2.6.3 Hyperband -- 2.7 Summary -- References -- 3 HPEM Coupling and Interaction; 3.1 EM Interaction Coupling Model -- 3.2 Topological Concept -- 3.3 Transfer Functions -- 3.3.1 Antenna Transfer Function -- 3.3.2 Free-Space Wave Propagation -- 3.3.3 Coupling/Radiation Efficiency -- 3.3.4 Diffusion Penetration -- 3.3.5 Aperture Penetration -- 3.3.6 Conducted Propagation -- 3.3.7 Galvanic, Capacitive, and Magnetic Coupling -- 3.3.8 Capacitive Coupling -- 3.3.9 Inductive Coupling -- 3.4 Field Variation Inside System Enclosure -- 3.5 Overall Response -- 3.5.1 Devices, Equipment, Systems, Networks, and Infrastructure -- 3.5.2 Coupling as a Function of HPEM Environment Type; References -- 4 Overview of HPEM Test Facilities and Techniques -- 4.1 Introduction -- 4.1.1 General Considerations for the Scenario -- 4.1.2 General Considerations for HPEM Environment Simulation -- 4.1.3 General Considerations of the SUT -- 4.1.4 Summary -- 4.2 Uncertainty in Effects Testing -- 4.3 HPEM Effects Test Methods and Facilities -- 4.3.1 HPEM-Radiated Testing -- 4.3.2 HPEM-Radiated Test Facilities and HPEM Environment Simulation -- 4.3.3 Measuring the Radiated HPEM Environment -- 4.3.4 The Measurement Chain -- 4.3.5 HPEM Conducted Testing; 4.3.6 Measuring the Conducted HPEM Environment -- 4.4 Exercising and Observing the SUT -- 4.5 Effects Data Presentation -- 4.6 Other Practical Considerations for HPEM Effects Testing -- 4.7 Summary -- References -- 5 HPEM Effects Mechanisms -- 5.1 Introduction -- 5.2 Terminology -- 5.2.1 About This Chapter -- 5.3 Device and Circuit-Level Effects -- 5.3.1 Rectification -- 5.3.2 Noise -- 5.3.3 Interference or Jamming -- 5.3.4 Saturation -- 5.3.5 Shift in Operating Point -- 5.3.6 False Information -- 5.3.7 Transient Upset -- 5.3.8 Chaotic Effects -- 5.3.9 Damage and Destruction; 5.3.10 Published Device and Circuit-Level Effects Data
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