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Microplasticity of idealized single crystalline Ag cantilevers characterized with methods of high resolution

By:

Wobrock, Mark [auth]

Material type: Article

ArticleLanguage: English Publication details: KIT Scientific Publishing 2017Description: 1 electronic resource (XIII, 215 p. p.)ISBN:

KSP/1000070130
9783731506829

Subject(s):

Online resources:

Summary: Single crystalline, µm-sized cantilevers are fabricated out of epitaxially grown Ag thin films by a lithography-based procedure and are deflected by a nanoindenter system. The microstructure of the plastically deformed cantile-vers is investigated using transmission Kikuchi diffraction (TKD) on the cantilever cross section. 3D discrete dislocation dynamics simulations (DDD) are performed for further analysis. A mechanism to explain the formation of dislocation networks upon loading is suggested.

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Single crystalline, µm-sized cantilevers are fabricated out of epitaxially grown Ag thin films by a lithography-based procedure and are deflected by a nanoindenter system. The microstructure of the plastically deformed cantile-vers is investigated using transmission Kikuchi diffraction (TKD) on the cantilever cross section. 3D discrete dislocation dynamics simulations (DDD) are performed for further analysis. A mechanism to explain the formation of dislocation networks upon loading is suggested.

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