Microelectronics failure analysis : desk reference / edited by Richard J. Ross ; EDFAS, ASM International.
Material type:
TextPublication details: Materials Park, Ohio : ASM International, ©2011.Edition: 6th edDescription: 1 online resource (xi, 660 pages) : illustrationsContent type: - text
- computer
- online resource
- 9781613447598
- 1613447590
- 9781615037261
- 1615037268
- 9781615037261
- Microelectronics failure analysis desk reference
- Microelectronics -- Materials -- Testing -- Handbooks, manuals, etc
- Microelectronics -- Defects -- Testing -- Handbooks, manuals, etc
- Electronic apparatus and appliances -- Testing -- Handbooks, manuals, etc
- Electronics -- Materials -- Testing -- Handbooks, manuals, etc
- Electronics -- Materials -- Defects -- Handbooks, manuals, etc
- Appareils électroniques -- Essais -- Guides, manuels, etc
- Électronique -- Matériaux -- Guides, manuels, etc
- TECHNOLOGY & ENGINEERING -- Electronics -- Digital
- TECHNOLOGY & ENGINEERING -- Electronics -- Microelectronics
- Electronic apparatus and appliances -- Testing
- Electronics -- Materials -- Defects
- Electronics -- Materials -- Testing
- Microelectronics -- Materials -- Testing
- 621.381 23
- TK7871 .M52 2011eb
| Item type | Home library | Collection | Call number | Materials specified | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|
Electronic-Books
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OPJGU Sonepat- Campus | E-Books EBSCO | Available |
"ASM International, 2011, no. 09110Z"--Page 4 of cover
Some online versions lack accompanying media packaged with the printed version.
Includes bibliographical references and indexes.
Print version record.
Section 1. Introduction -- section 2. Failure analysis process overviews -- section 3. Failure analysis topics -- section 4. Fault verification and classification -- section 5. Localization techniques -- section 6. Deprocessing and sample preparation -- section 7. Inspection -- section 8. Materials analysis -- section 9. Focused ion beam applications -- section 10. Management and reference information.
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