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Reliability, maintainability, and risk : practical methods for engineers / David J. Smith.

By: Material type: TextTextCopyright date: ©2001Edition: 6th edDescription: 1 online resource (xii, 335 pages) : illustrationsContent type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9780080516097
  • 0080516092
  • 0750651687
  • 9780750651684
Subject(s): Genre/Form: Additional physical formats: Print version:: Reliability, maintainability, and risk.DDC classification:
  • 620/.00452 22
LOC classification:
  • TA169 .S64 2001eb
Online resources:
Contents:
Front Cover; Reliability, Maintainability and Risk: Practical methods for engineers; Copyright Page; Contents; Preface; Acknowledgements; Part One: Understanding Reliability Parameters and Costs; Part Two: Interpreting Failure Rates; Part Three: Predicting Reliability and Risk; Part Four: Achieving Reliability and Maintainability; Part Five: Legal, Management and Safety Considerations; Appendix 1. Glossary; Appendix 2. Percentage points of the Chi-square distribution; Appendix 3. Microelectronics failure rates; Appendix 4. General failure rates; Appendix 5. Failure mode percentages.
Summary: This revised edition takes into account current emphasis on risk assessment techniques and safety critical systems, as well as major incident legislation. New material in this text covers reliability-centred maintenance, data analysis and includes more worked examples.
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Electronic-Books Electronic-Books OPJGU Sonepat- Campus E-Books EBSCO Available

Includes bibliographical references and index.

Print version record.

Front Cover; Reliability, Maintainability and Risk: Practical methods for engineers; Copyright Page; Contents; Preface; Acknowledgements; Part One: Understanding Reliability Parameters and Costs; Part Two: Interpreting Failure Rates; Part Three: Predicting Reliability and Risk; Part Four: Achieving Reliability and Maintainability; Part Five: Legal, Management and Safety Considerations; Appendix 1. Glossary; Appendix 2. Percentage points of the Chi-square distribution; Appendix 3. Microelectronics failure rates; Appendix 4. General failure rates; Appendix 5. Failure mode percentages.

This revised edition takes into account current emphasis on risk assessment techniques and safety critical systems, as well as major incident legislation. New material in this text covers reliability-centred maintenance, data analysis and includes more worked examples.

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