Confocal scanning optical microscopy and related imaging systems / Timothy R. Corle, Gordon S. Kino.

By:

Corle, Timothy R

Contributor(s):

Kino, Gordon S

Material type: Text

text

Media type:

computer

Carrier type:

online resource

ISBN:

9780124087507
0124087507
9780080529783
008052978X
1281046698
9781281046697

Subject(s):

Genre/Form:

Electronic books.

Additional physical formats: Print version:: Confocal scanning optical microscopy and related imaging systems.DDC classification:

502/.8/2 22

LOC classification:

QH224 .C67 1996eb

Online resources:

Click here to access online

Contents:

Introduction. Instruments. Depth and Transverse Resolution. Phase Imaging. Applications. Appendix A: Vector Field Theory for Depth and Transverse Resolution of a CSOM.

Summary: This book provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers. The book concentrates mainly on two instruments: the Confocal Scanning Optical Microscope (CSOM), and the Optical Interference Microscope (OIM). A comprehensive discussion of the theory and design of the Near-Field Scanning Optical Microscope (NSOM) is also given. The text discusses the practical aspects of building a confocal scanning optical microscope or optical interference microscope, and the applications of these microscopes to phase imaging, biological imaging, and semiconductor inspection and metrology. A comprehensive theoretical discussion of the depth and transverse resolution is given with emphasis placed on the practical results of the theoretical calculations and how these can be used to help understand the operation of these microscopes. Key Features * Provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers * Explains many practical applications of scanning optical and interference microscopy in such diverse fields as biology and semiconductor metrology * Discusses in theoretical terms the origin of the improved depth and transverse resolution of scanning optical and interference microscopes with emphasis on the practical results of the theoretical calculations * Considers the practical aspects of building a confocal scanning or interference microscope and explores some of the design tradeoffs made for microscopes used in various applications * Discusses the theory and design of near-field optical microscopes * Explains phase imaging in the scanning optical and interference microscopes.

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Item type	Home library	Collection	Call number	Materials specified	Status	Date due	Barcode
Electronic-Books	OPJGU Sonepat- Campus	E-Books EBSCO			Available

This book provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers. The book concentrates mainly on two instruments: the Confocal Scanning Optical Microscope (CSOM), and the Optical Interference Microscope (OIM). A comprehensive discussion of the theory and design of the Near-Field Scanning Optical Microscope (NSOM) is also given. The text discusses the practical aspects of building a confocal scanning optical microscope or optical interference microscope, and the applications of these microscopes to phase imaging, biological imaging, and semiconductor inspection and metrology. A comprehensive theoretical discussion of the depth and transverse resolution is given with emphasis placed on the practical results of the theoretical calculations and how these can be used to help understand the operation of these microscopes. Key Features * Provides a comprehensive introduction to the field of scanning optical microscopy for scientists and engineers * Explains many practical applications of scanning optical and interference microscopy in such diverse fields as biology and semiconductor metrology * Discusses in theoretical terms the origin of the improved depth and transverse resolution of scanning optical and interference microscopes with emphasis on the practical results of the theoretical calculations * Considers the practical aspects of building a confocal scanning or interference microscope and explores some of the design tradeoffs made for microscopes used in various applications * Discusses the theory and design of near-field optical microscopes * Explains phase imaging in the scanning optical and interference microscopes.

Introduction. Instruments. Depth and Transverse Resolution. Phase Imaging. Applications. Appendix A: Vector Field Theory for Depth and Transverse Resolution of a CSOM.