X-ray scattering from semiconductors / Paul F. Fewster.

By:

Fewster, Paul F

Material type: Text

text

Media type:

computer

Carrier type:

online resource

ISBN:

1860944582
9781860944581

Subject(s): Genre/Form:

Additional physical formats: Print version:: X-ray scattering from semiconductors.DDC classification:

539.7222 22

LOC classification:

QC482.S3 F49 2003eb

Other classification:

O434. 19
O472-3

Online resources:

Click here to access online

Contents:

Copyright; Preface; Contents; 1 -- An Introduction to Semiconductor Materials; 2 -- An Introduction to X-Ray Scattering; 3 -- Equipment for Measuring Diffraction Patterns; 4 -- A Practical Guide to the Evaluation of Structural Parameters; Appendix 1; Subject Index.

Summary: This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection.

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Electronic-Books	OPJGU Sonepat- Campus	E-Books EBSCO			Available

Includes bibliographical references and index.

Print version record.

This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection.

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