Normal view
MARC view
- Metal oxide semiconductor field-effect transistors
Entry Topical Term
001 - CONTROL NUMBER
- control field: 1634118
003 - CONTROL NUMBER IDENTIFIER
- control field: JGU
005 - DATE AND TIME OF LATEST TRANSACTION
- control field: 20220716183852.0
008 - FIXED-LENGTH DATA ELEMENTS
- fixed length control field: 220716|| aca||aabn | a|a d
040 ## - CATALOGING SOURCE
- Original cataloging agency: JGU
- Transcribing agency: JGU
150 ## - HEADING--TOPICAL TERM
- Topical term or geographic name as entry element: Metal oxide semiconductor field-effect transistors
- General subdivision: Reliability
670 ## - SOURCE DATA FOUND
- Source citation: Work cat.: (JGU)3052035: Maiti, C. K., author. 1427541, Strain-engineered MOSFETs /