Radiation Tolerant Electronics (Record no. 2996845)

MARC details
000 -LEADER
fixed length control field 05058naaaa2201225uu 4500
001 - CONTROL NUMBER
control field https://directory.doabooks.org/handle/20.500.12854/57568
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20220714175148.0
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number books978-3-03921-280-4
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783039212804
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783039212798
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.3390/books978-3-03921-280-4
Terms of availability doi
041 0# - LANGUAGE CODE
Language code of text/sound track or separate title English
042 ## - AUTHENTICATION CODE
Authentication code dc
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Leroux, Paul
Relator code auth
9 (RLIN) 1593210
245 10 - TITLE STATEMENT
Title Radiation Tolerant Electronics
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Name of publisher, distributor, etc MDPI - Multidisciplinary Digital Publishing Institute
Date of publication, distribution, etc 2019
300 ## - PHYSICAL DESCRIPTION
Extent 1 electronic resource (210 p.)
506 0# - RESTRICTIONS ON ACCESS NOTE
Terms governing access Open Access
Source of term star
Standardized terminology for access restriction Unrestricted online access
520 ## - SUMMARY, ETC.
Summary, etc Research on radiation-tolerant electronics has increased rapidly over the past few years, resulting in many interesting approaches to modeling radiation effects and designing radiation-hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation-hardened electronics for space applications, high-energy physics experiments such as those on the Large Hadron Collider at CERN, and many terrestrial nuclear applications including nuclear energy and nuclear safety. With the progressive scaling of integrated circuit technologies and the growing complexity of electronic systems, their susceptibility to ionizing radiation has raised many exciting challenges, which are expected to drive research in the coming decade. In this book we highlight recent breakthroughs in the study of radiation effects in advanced semiconductor devices, as well as in high-performance analog, mixed signal, RF, and digital integrated circuits. We also focus on advances in embedded radiation hardening in both FPGA and microcontroller systems and apply radiation-hardened embedded systems for cryptography and image processing, targeting space applications.
540 ## - TERMS GOVERNING USE AND REPRODUCTION NOTE
Terms governing use and reproduction Creative Commons
-- https://creativecommons.org/licenses/by-nc-nd/4.0/
-- cc
-- https://creativecommons.org/licenses/by-nc-nd/4.0/
546 ## - LANGUAGE NOTE
Language note English
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Uncontrolled term single event effects
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Uncontrolled term n/a
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Uncontrolled term frequency divider by two
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Uncontrolled term CMOS analog integrated circuits
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Uncontrolled term frequency synthesizers
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Uncontrolled term PLL
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Uncontrolled term ionization
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Uncontrolled term radiation tolerant
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Uncontrolled term neutron irradiation effects
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Uncontrolled term digital integrated circuits
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Uncontrolled term nuclear fusion
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Uncontrolled term radiation-hardened
856 40 - ELECTRONIC LOCATION AND ACCESS
Host name www.oapen.org
Uniform Resource Identifier <a href="https://mdpi.com/books/pdfview/book/1518">https://mdpi.com/books/pdfview/book/1518</a>
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Public note DOAB: download the publication
856 40 - ELECTRONIC LOCATION AND ACCESS
Host name www.oapen.org
Uniform Resource Identifier <a href="https://directory.doabooks.org/handle/20.500.12854/57568">https://directory.doabooks.org/handle/20.500.12854/57568</a>
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Public note DOAB: description of the publication
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