MARC details
000 -LEADER |
fixed length control field |
05058naaaa2201225uu 4500 |
001 - CONTROL NUMBER |
control field |
https://directory.doabooks.org/handle/20.500.12854/57568 |
005 - DATE AND TIME OF LATEST TRANSACTION |
control field |
20220714175148.0 |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
books978-3-03921-280-4 |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
9783039212804 |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
9783039212798 |
024 7# - OTHER STANDARD IDENTIFIER |
Standard number or code |
10.3390/books978-3-03921-280-4 |
Terms of availability |
doi |
041 0# - LANGUAGE CODE |
Language code of text/sound track or separate title |
English |
042 ## - AUTHENTICATION CODE |
Authentication code |
dc |
100 1# - MAIN ENTRY--PERSONAL NAME |
Personal name |
Leroux, Paul |
Relator code |
auth |
9 (RLIN) |
1593210 |
245 10 - TITLE STATEMENT |
Title |
Radiation Tolerant Electronics |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
Name of publisher, distributor, etc |
MDPI - Multidisciplinary Digital Publishing Institute |
Date of publication, distribution, etc |
2019 |
300 ## - PHYSICAL DESCRIPTION |
Extent |
1 electronic resource (210 p.) |
506 0# - RESTRICTIONS ON ACCESS NOTE |
Terms governing access |
Open Access |
Source of term |
star |
Standardized terminology for access restriction |
Unrestricted online access |
520 ## - SUMMARY, ETC. |
Summary, etc |
Research on radiation-tolerant electronics has increased rapidly over the past few years, resulting in many interesting approaches to modeling radiation effects and designing radiation-hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation-hardened electronics for space applications, high-energy physics experiments such as those on the Large Hadron Collider at CERN, and many terrestrial nuclear applications including nuclear energy and nuclear safety. With the progressive scaling of integrated circuit technologies and the growing complexity of electronic systems, their susceptibility to ionizing radiation has raised many exciting challenges, which are expected to drive research in the coming decade. In this book we highlight recent breakthroughs in the study of radiation effects in advanced semiconductor devices, as well as in high-performance analog, mixed signal, RF, and digital integrated circuits. We also focus on advances in embedded radiation hardening in both FPGA and microcontroller systems and apply radiation-hardened embedded systems for cryptography and image processing, targeting space applications. |
540 ## - TERMS GOVERNING USE AND REPRODUCTION NOTE |
Terms governing use and reproduction |
Creative Commons |
-- |
https://creativecommons.org/licenses/by-nc-nd/4.0/ |
-- |
cc |
-- |
https://creativecommons.org/licenses/by-nc-nd/4.0/ |
546 ## - LANGUAGE NOTE |
Language note |
English |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
single event effects |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
n/a |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
radiation-hardening-by-design (RHBD) |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
frequency divider by two |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
single event upset |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
Image processing |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
CMOS analog integrated circuits |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
FPGA |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
total ionizing dose (TID) |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
Impulse Sensitive Function |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
soft error |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
hardening by design |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
radiation hardening by design |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
X-rays |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
Single-Event Upsets (SEUs) |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
line buffer |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
heavy ions |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
VHDL |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
FPGA-based digital controller |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
radiation hardening by design (RHBD) |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
radiation hardening |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
SRAM-based FPGA |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
proton irradiation |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
ring oscillator |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
sensor readout IC |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
fault tolerance |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
space application |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
physical unclonable function |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
voltage controlled oscillator (VCO) |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
Ring Oscillators |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
analog single-event transient (ASET) |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
single event opset (SEU) |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
SEB |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
single event upsets |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
bipolar transistor |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
total ionizing dose |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
protons |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
triple modular redundancy (TMR) |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
gain degradation |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
space electronics |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
saturation effect |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
configuration memory |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
Co-60 gamma radiation |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
total ionization dose (TID) |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
frequency synthesizers |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
CMOS |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
PLL |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
TDC |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
single-event upsets (SEUs) |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
bandgap voltage reference (BGR) |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
4MR |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
single-shot |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
error rates |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
Radiation Hardening by Design |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
soft errors |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
heavy-ions |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
single-event effects (SEE) |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
single event transient (SET) |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
SEE testing |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
proton irradiation effects |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
RFIC |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
single event upset (SEU) |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
FMR |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
ionization |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
radiation tolerant |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
triplex-duplex |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
neutron irradiation effects |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
digital integrated circuits |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
single event gate rupture (SEGR) |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
power MOSFETs |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
ring-oscillator |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
selective hardening |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
voltage reference |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
nuclear fusion |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
TMR |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
gamma-rays |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
gamma ray |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
instrumentation amplifier |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
radiation effects |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
reference circuits |
653 ## - INDEX TERM--UNCONTROLLED |
Uncontrolled term |
radiation-hardened |
856 40 - ELECTRONIC LOCATION AND ACCESS |
Host name |
www.oapen.org |
Uniform Resource Identifier |
<a href="https://mdpi.com/books/pdfview/book/1518">https://mdpi.com/books/pdfview/book/1518</a> |
-- |
0 |
Public note |
DOAB: download the publication |
856 40 - ELECTRONIC LOCATION AND ACCESS |
Host name |
www.oapen.org |
Uniform Resource Identifier |
<a href="https://directory.doabooks.org/handle/20.500.12854/57568">https://directory.doabooks.org/handle/20.500.12854/57568</a> |
-- |
0 |
Public note |
DOAB: description of the publication |