MARC details
000 -LEADER |
fixed length control field |
04529cam a2200685 i 4500 |
001 - CONTROL NUMBER |
control field |
on1079759430 |
003 - CONTROL NUMBER IDENTIFIER |
control field |
OCoLC |
005 - DATE AND TIME OF LATEST TRANSACTION |
control field |
20220712083044.0 |
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS--GENERAL INFORMATION |
fixed length control field |
m o d |
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION |
fixed length control field |
cr cnu---unuuu |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
181220s2018 enka ob 000 0 eng d |
040 ## - CATALOGING SOURCE |
Original cataloging agency |
N$T |
Language of cataloging |
eng |
Description conventions |
rda |
-- |
pn |
Transcribing agency |
N$T |
Modifying agency |
YDX |
-- |
EBLCP |
-- |
UKMGB |
-- |
ESU |
-- |
UKAHL |
-- |
OCLCQ |
-- |
ELBRO |
-- |
OCLCQ |
-- |
OCLCO |
015 ## - NATIONAL BIBLIOGRAPHY NUMBER |
National bibliography number |
GBB902414 |
Source |
bnb |
016 7# - NATIONAL BIBLIOGRAPHIC AGENCY CONTROL NUMBER |
Record control number |
019193416 |
Source |
Uk |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
9781527523425 |
Qualifying information |
(electronic bk.) |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
152752342X |
Qualifying information |
(electronic bk.) |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
Cancelled/invalid ISBN |
1527506355 |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
Cancelled/invalid ISBN |
9781527506350 |
029 1# - (OCLC) |
OCLC library identifier |
UKMGB |
System control number |
019193416 |
035 ## - SYSTEM CONTROL NUMBER |
System control number |
(OCoLC)1079759430 |
037 ## - SOURCE OF ACQUISITION |
Stock number |
9781527523425 |
Source of stock number/acquisition |
Cambridge Scholars Publishing |
050 #4 - LIBRARY OF CONGRESS CALL NUMBER |
Classification number |
QC611.6.D4 |
Item number |
T35 2018eb |
072 #7 - SUBJECT CATEGORY CODE |
Subject category code |
TEC |
Subject category code subdivision |
009070 |
Source |
bisacsh |
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
621.3815/2 |
Edition number |
23 |
049 ## - LOCAL HOLDINGS (OCLC) |
Holding library |
MAIN |
100 1# - MAIN ENTRY--PERSONAL NAME |
Personal name |
Talanin, V. I. |
Fuller form of name |
(Vitaliĭ Igorʹevich), |
Relator term |
author. |
9 (RLIN) |
1218613 |
245 14 - TITLE STATEMENT |
Title |
The formation of structural imperfections in semiconductor silicon / |
Statement of responsibility, etc |
by V.I. Talanin and I.E. Talanin. |
264 #1 - |
-- |
Newcastle upon Tyne, UK : |
-- |
Cambridge Scholars Publishing, |
-- |
2018. |
300 ## - PHYSICAL DESCRIPTION |
Extent |
1 online resource (xii, 269 pages) : |
Other physical details |
illustrations |
336 ## - |
-- |
text |
-- |
txt |
-- |
rdacontent |
337 ## - |
-- |
computer |
-- |
c |
-- |
rdamedia |
338 ## - |
-- |
online resource |
-- |
cr |
-- |
rdacarrier |
520 ## - SUMMARY, ETC. |
Summary, etc |
"Today, it is difficult to imagine all spheres of human activity without personal computers, solid-state electronic devices, micro- and nanoelectronics, photoconverters, and mobile communication devices. The basic material of modern electronics and for all of these industries is semiconductor silicon. Its properties and applications are determined by defects in its crystal structure. However, until now, there has been no complete and reliable description of the creation and transformation of such a defective structure. This book solves this mystery through two different approaches to semiconductor silicon: the classical and the probabilistic. This book brings together, for the first time, all existing experimental and theoretical information on the internal structure of semiconductor silicon. It will appeal to a wide range of readers, from materials scientists and practical engineers to students."-- |
-- |
Back cover |
504 ## - BIBLIOGRAPHY, ETC. NOTE |
Bibliography, etc |
Includes bibliographical references (pages 239-267). |
505 0# - FORMATTED CONTENTS NOTE |
Formatted contents note |
Chapter one. Growth of dislocation-free silicon single crystals from melt and defect formation -- Chapter two. Physical modeling of defect formation processes in dislocation-free single crystals of silicon -- Chapter three. Physical basis of a heterogenous (two-stage) model of grown-in microdefect formation -- Chapter four. High-temperature precipitation of impurity in dislocation-free silicon single crystals -- Chapter five. The formation of microvoids and interstitial dislocation loops during crystal cooling after growing -- Chapter six. General approach to the engineering of defects in semiconductor silicon. |
588 0# - |
-- |
Print version record. |
590 ## - LOCAL NOTE (RLIN) |
Local note |
eBooks on EBSCOhost |
Provenance (VM) [OBSOLETE] |
EBSCO eBook Subscription Academic Collection - Worldwide |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Silicon |
General subdivision |
Structure. |
9 (RLIN) |
1218614 |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Semiconductors |
General subdivision |
Impurity distribution. |
9 (RLIN) |
1218615 |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Semiconductors |
General subdivision |
Materials. |
9 (RLIN) |
288696 |
650 #6 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Silicium |
General subdivision |
Structure. |
9 (RLIN) |
1218616 |
650 #6 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Semi-conducteurs |
General subdivision |
Diffusion des impuretés. |
9 (RLIN) |
1218617 |
650 #6 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Semi-conducteurs |
General subdivision |
Matériaux. |
9 (RLIN) |
909770 |
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Condensed matter physics (liquid state & solid state physics) |
Source of heading or term |
bicssc |
9 (RLIN) |
1218618 |
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Materials science. |
Source of heading or term |
bicssc |
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Mathematical modelling. |
Source of heading or term |
bicssc |
9 (RLIN) |
1093021 |
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
TECHNOLOGY & ENGINEERING |
General subdivision |
Mechanical. |
Source of heading or term |
bisacsh |
9 (RLIN) |
91801 |
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Semiconductors |
General subdivision |
Impurity distribution. |
Source of heading or term |
fast |
-- |
(OCoLC)fst01112226 |
9 (RLIN) |
1218615 |
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Semiconductors |
General subdivision |
Materials. |
Source of heading or term |
fast |
-- |
(OCoLC)fst01112237 |
9 (RLIN) |
288696 |
655 #4 - INDEX TERM--GENRE/FORM |
Genre/form data or focus term |
Electronic books. |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Talanin, I. E. |
Fuller form of name |
(Igor Evgenievich), |
Relator term |
author. |
9 (RLIN) |
1218619 |
776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
Display text |
Print version: |
Main entry heading |
Talanin, V.I. (Vitaliĭ Igorʹevich). |
Title |
Formation of structural imperfections in semiconductor silicon. |
Place, publisher, and date of publication |
Newcastle upon Tyne, UK : Cambridge Scholars Publishing, 2018 |
International Standard Book Number |
1527506355 |
Record control number |
(OCoLC)1019739852 |
856 40 - ELECTRONIC LOCATION AND ACCESS |
Uniform Resource Identifier |
<a href="https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=1986604">https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=1986604</a> |
938 ## - |
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Askews and Holts Library Services |
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ASKH |
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AH35778007 |
938 ## - |
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ProQuest Ebook Central |
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EBLB |
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EBL5621998 |
938 ## - |
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EBSCOhost |
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EBSC |
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1986604 |
938 ## - |
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eLibro |
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ELBO |
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ELB120272 |
938 ## - |
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YBP Library Services |
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YANK |
-- |
15900544 |
994 ## - |
-- |
92 |
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INOPJ |