MARC details
| 000 -LEADER |
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| fixed length control field |
07816cam a2200925Mi 4500 |
| 001 - CONTROL NUMBER |
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| control field |
ocn936210003 |
| 003 - CONTROL NUMBER IDENTIFIER |
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OCoLC |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
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| control field |
20220712024933.0 |
| 006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS--GENERAL INFORMATION |
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m eo d |
| 007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION |
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| fixed length control field |
cr cn||||m|||a |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
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| fixed length control field |
151227s2016 nyua foab 001 0 eng d |
| 040 ## - CATALOGING SOURCE |
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| Original cataloging agency |
NYMPP |
| Language of cataloging |
eng |
| Description conventions |
rda |
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pn |
| Transcribing agency |
NYMPP |
| Modifying agency |
OCLCO |
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OCLCF |
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YDXCP |
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N$T |
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NRC |
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STF |
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G3B |
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IGB |
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OCLCQ |
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OCLCO |
| 019 ## - |
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959328517 |
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962433050 |
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965415489 |
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1058498835 |
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1096237258 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| International Standard Book Number |
9781606507032 |
| Qualifying information |
(electronic bk.) |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| International Standard Book Number |
1606507036 |
| Qualifying information |
(electronic bk.) |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| International Standard Book Number |
9781606507049 |
| Qualifying information |
(electronic bk.) |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| International Standard Book Number |
1606507044 |
| Qualifying information |
(electronic bk.) |
| 024 7# - OTHER STANDARD IDENTIFIER |
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| Standard number or code |
10.5643/9781606507049 |
| Source of number or code |
doi |
| 035 ## - SYSTEM CONTROL NUMBER |
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| System control number |
(OCoLC)936210003 |
| Canceled/invalid control number |
(OCoLC)959328517 |
| -- |
(OCoLC)962433050 |
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(OCoLC)965415489 |
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(OCoLC)1058498835 |
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(OCoLC)1096237258 |
| 050 #4 - LIBRARY OF CONGRESS CALL NUMBER |
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| Classification number |
QH212.T7 |
| Item number |
L866 2016 |
| 072 #7 - SUBJECT CATEGORY CODE |
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| Subject category code |
SCI |
| Subject category code subdivision |
000000 |
| Source |
bisacsh |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
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| Classification number |
502.825 |
| Edition number |
23 |
| 049 ## - LOCAL HOLDINGS (OCLC) |
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| Holding library |
MAIN |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
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| Personal name |
Luo, Zhiping., |
| Relator term |
author. |
| 9 (RLIN) |
1096524 |
| 245 12 - TITLE STATEMENT |
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| Title |
A practical guide to transmission electron microscopy : |
| Remainder of title |
fundamentals / |
| Statement of responsibility, etc |
Zhiping Luo. |
| 250 ## - EDITION STATEMENT |
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| Edition statement |
First edition. |
| 264 #1 - |
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| -- |
New York [New York] (222 East 46th Street, New York, NY 10017) : |
| -- |
Momentum Press, |
| -- |
2016. |
| 300 ## - PHYSICAL DESCRIPTION |
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| Extent |
1 online resource (1 PDF (xiv, 152 pages)) : |
| Other physical details |
illustrations |
| 336 ## - |
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text |
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txt |
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rdacontent |
| 337 ## - |
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electronic |
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isbdmedia |
| 338 ## - |
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online resource |
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cr |
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rdacarrier |
| 490 1# - SERIES STATEMENT |
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| Series statement |
Materials characterization and analysis collection, |
| International Standard Serial Number |
2377-4355 |
| 500 ## - GENERAL NOTE |
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| General note |
Title from PDF title page (viewed on December 27, 2015). |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
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| Bibliography, etc |
Includes bibliographical references and index. |
| 505 0# - FORMATTED CONTENTS NOTE |
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| Formatted contents note |
1. Introduction -- 1.1 Microscope resolution -- 1.2 Interactions of electrons with specimen -- 1.3 Comparison of TEM with other microscopy techniques -- References |
| 505 8# - FORMATTED CONTENTS NOTE |
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| Formatted contents note |
2. Sample preparation -- 2.1 Material samples -- 2.1.1 TEM grids -- 2.1.2 Ion milling -- 2.1.3 Electropolishing -- 2.1.4 Focused ion beam -- 2.1.5 Microtomy -- 2.2 Biological samples -- 2.2.1 Particulate samples -- 2.2.2 Cells and tissue samples -- References |
| 505 8# - FORMATTED CONTENTS NOTE |
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| Formatted contents note |
3. Instrumentation and operation -- 3.1 Construction -- 3.1.1 Electron gun -- 3.1.2 Electromagnetic lens -- 3.1.3 Condenser lenses and condenser apertures -- 3.1.4 Objective lens and objective aperture -- 3.1.5 Intermediate lens and diffraction aperture -- 3.1.6 Projector lens -- 3.1.7 Viewing screen and camera -- 3.2 Instrument imperfections, alignments, corrections, and calibrations -- 3.2.1 Beam shift and beam tilt -- 3.2.2 Spherical aberration -- 3.2.3 Chromatic aberration -- 3.2.4 Depth of field and depth of focus -- 3.2.5 Specimen height -- 3.2.6 Astigmatism -- 3.2.7 Aperture alignment -- 3.2.8 Magnification calibration -- 3.2.9 Camera length calibration -- 3.2.10 Magnetic rotation calibration -- 3.3 TEM operating procedures -- 3.3.1 Startup -- 3.3.2 Specimen loading and unloading -- 3.3.3 Alignments -- 3.3.4 Data recording -- 3.3.5 Finishing -- References |
| 505 8# - FORMATTED CONTENTS NOTE |
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| Formatted contents note |
4. Electron diffraction I -- 4.1 Formation of electron diffraction -- 4.2 Reciprocal space -- 4.3 Indexing of electron diffraction patterns -- 4.3.1 Indexing of powder patterns -- 4.3.2 Indexing of single-crystal diffraction patterns -- 4.3.3 Indexing of compound patterns: twins -- 4.3.4 Indexing of compound patterns: multiple phases -- 4.3.5 Indexing of compound patterns: double diffraction -- 4.4 Experimental procedures -- 4.5 Simulation of diffraction patterns -- References |
| 505 8# - FORMATTED CONTENTS NOTE |
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| Formatted contents note |
5. Imaging I -- 5.1 Imaging contrast -- 5.2 Imaging with mass-thickness contrast -- 5.3 Imaging with diffraction contrast -- 5.3.1 Formation of diffraction contrast -- 5.3.2 Central dark-field imaging -- 5.3.3 Two-beam condition -- 5.3.4 Bragg-diffracted beam intensity -- 5.3.5 Thickness fringes -- 5.3.6 Bend contours -- 5.3.7 Weak-beam dark-field imaging -- 5.3.8 Planar defects -- 5.3.9 Dislocations -- References |
| 505 8# - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
Appendices -- Appendix I. SAED indexing table of primitive cubic structure -- Appendix II. SAED indexing table of body-centered cubic structure -- Appendix III. SAED indexing table of face-centered cubic structure -- Appendix IV. SAED indexing table of close-packed hexagonal structure -- Illustration credits -- Index. |
| 520 3# - SUMMARY, ETC. |
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| Summary, etc |
Transmission electron microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a scanning electron microscope, SEM, at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. Nowadays, TEM is widely applied in diverse areas in both physical sciences (chemistry, engineering, geosciences, materials science, and physics) and life sciences (agriculture, biology, and medicine), playing a key role in research or development for material design, synthesis, processing, or performance. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. It is written primarily for materials science and engineering or related disciplines, while some applications in life sciences are also included. It covers most of the areas using TEM, including the instrumentation, sample preparation, diffraction, imaging, analytical microscopy, and some newly developed advanced microscopy techniques. In each topic, a theoretical background is firstly briefly outlined, followed with step-by-step instructions in experimental operation or computation. Some technical tips are given in order to obtain the best results. The practical procedures to acquire, analyze, and interpret the TEM data are therefore provided. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills. |
| 590 ## - LOCAL NOTE (RLIN) |
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| Local note |
eBooks on EBSCOhost |
| Provenance (VM) [OBSOLETE] |
EBSCO eBook Subscription Academic Collection - Worldwide |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Transmission electron microscopy. |
| 9 (RLIN) |
165306 |
| 650 #6 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Microscopie électronique à transmission. |
| 9 (RLIN) |
962771 |
| 650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
SCIENCE |
| General subdivision |
General. |
| Source of heading or term |
bisacsh |
| 9 (RLIN) |
868088 |
| 650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Transmission electron microscopy. |
| Source of heading or term |
fast |
| -- |
(OCoLC)fst01154860 |
| 9 (RLIN) |
165306 |
| 653 ## - INDEX TERM--UNCONTROLLED |
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| Uncontrolled term |
Analytical Electron Microscopy |
| 653 ## - INDEX TERM--UNCONTROLLED |
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| Uncontrolled term |
Ceramics |
| 653 ## - INDEX TERM--UNCONTROLLED |
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| Uncontrolled term |
Chemical Analysis |
| 653 ## - INDEX TERM--UNCONTROLLED |
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| Uncontrolled term |
Chemistry |
| 653 ## - INDEX TERM--UNCONTROLLED |
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| Uncontrolled term |
Composites |
| 653 ## - INDEX TERM--UNCONTROLLED |
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| Uncontrolled term |
Crystallography |
| 653 ## - INDEX TERM--UNCONTROLLED |
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| Uncontrolled term |
Electron Diffraction |
| 653 ## - INDEX TERM--UNCONTROLLED |
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| Uncontrolled term |
Electron Energy- Loss Spectroscopy (EELS) |
| 653 ## - INDEX TERM--UNCONTROLLED |
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| Uncontrolled term |
Forensic Science |
| 653 ## - INDEX TERM--UNCONTROLLED |
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| Uncontrolled term |
Geosciences |
| 653 ## - INDEX TERM--UNCONTROLLED |
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| Uncontrolled term |
Imaging |
| 653 ## - INDEX TERM--UNCONTROLLED |
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| Uncontrolled term |
Industry |
| 653 ## - INDEX TERM--UNCONTROLLED |
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| Uncontrolled term |
Life Sciences |
| 653 ## - INDEX TERM--UNCONTROLLED |
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| Uncontrolled term |
Materials Science and Engineering |
| 653 ## - INDEX TERM--UNCONTROLLED |
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| Uncontrolled term |
Metals and Alloys |
| 653 ## - INDEX TERM--UNCONTROLLED |
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| Uncontrolled term |
Microstructure |
| 653 ## - INDEX TERM--UNCONTROLLED |
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| Uncontrolled term |
Nanomaterials |
| 653 ## - INDEX TERM--UNCONTROLLED |
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| Uncontrolled term |
Nanoscience |
| 653 ## - INDEX TERM--UNCONTROLLED |
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| Uncontrolled term |
Nanotechnology |
| 653 ## - INDEX TERM--UNCONTROLLED |
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| Uncontrolled term |
Physics |
| 653 ## - INDEX TERM--UNCONTROLLED |
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| Uncontrolled term |
Scanning Transmission Electron Microscopy (STEM) |
| 653 ## - INDEX TERM--UNCONTROLLED |
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| Uncontrolled term |
Polymer |
| 653 ## - INDEX TERM--UNCONTROLLED |
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| Uncontrolled term |
Structure |
| 653 ## - INDEX TERM--UNCONTROLLED |
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| Uncontrolled term |
Transmission Electron Microscopy (TEM) |
| 653 ## - INDEX TERM--UNCONTROLLED |
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| Uncontrolled term |
X-ray Energy- Dispersive Spectroscopy (EDS) |
| 655 #4 - INDEX TERM--GENRE/FORM |
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| Genre/form data or focus term |
Electronic books. |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
|---|
| Display text |
Print version: |
| International Standard Book Number |
9781606507049 |
| 830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE |
|---|
| Uniform title |
Materials characterization and analysis collection. |
| -- |
2377-4355 |
| 9 (RLIN) |
855466 |
| 856 40 - ELECTRONIC LOCATION AND ACCESS |
|---|
| Uniform Resource Identifier |
<a href="https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=1104642">https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=1104642</a> |
| 938 ## - |
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EBSCOhost |
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EBSC |
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1104642 |
| 938 ## - |
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Momentum Press |
| -- |
NYMP |
| -- |
9781606507032 |
| 938 ## - |
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| -- |
YBP Library Services |
| -- |
YANK |
| -- |
12730093 |
| 994 ## - |
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| -- |
92 |
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INOPJ |
