Orientation of single crystals by back-reflection Laue pattern simulation / (Record no. 2752349)

MARC details
000 -LEADER
fixed length control field 05831cam a2200757 a 4500
001 - CONTROL NUMBER
control field ocn842264698
003 - CONTROL NUMBER IDENTIFIER
control field OCoLC
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20220711200527.0
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS--GENERAL INFORMATION
fixed length control field m o d
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr cnu---unuuu
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 130509s1999 si a ob 001 0 eng d
040 ## - CATALOGING SOURCE
Original cataloging agency N$T
Language of cataloging eng
Description conventions pn
Transcribing agency N$T
Modifying agency E7B
-- IDEBK
-- OCLCF
-- YDXCP
-- EBLCP
-- OCLCQ
-- AGLDB
-- OCLCQ
-- OCLCO
-- VTS
-- REC
-- STF
-- M8D
-- UKAHL
-- OCLCQ
-- LEAUB
-- OCLCQ
-- OCLCO
019 ## -
-- 853361940
-- 1086537761
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9789812817228
Qualifying information (electronic bk.)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9812817220
Qualifying information (electronic bk.)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Cancelled/invalid ISBN 9810228716
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Cancelled/invalid ISBN 9789810228712
029 1# - (OCLC)
OCLC library identifier AU@
System control number 000054193852
029 1# - (OCLC)
OCLC library identifier DEBBG
System control number BV043161723
029 1# - (OCLC)
OCLC library identifier DEBSZ
System control number 421264136
029 1# - (OCLC)
OCLC library identifier GBVCP
System control number 804628874
035 ## - SYSTEM CONTROL NUMBER
System control number (OCoLC)842264698
Canceled/invalid control number (OCoLC)853361940
-- (OCoLC)1086537761
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number QD945
Item number .M247 1999eb
072 #7 - SUBJECT CATEGORY CODE
Subject category code SCI
Subject category code subdivision 016000
Source bisacsh
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 548/.83
Edition number 22
084 ## - OTHER CLASSIFICATION NUMBER
Classification number UQ 5600
Source of number rvk
084 ## - OTHER CLASSIFICATION NUMBER
Classification number PHY 606f
Source of number stub
049 ## - LOCAL HOLDINGS (OCLC)
Holding library MAIN
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Marín, C.
Fuller form of name (Carlos),
Dates associated with a name 1970-
9 (RLIN) 944525
245 10 - TITLE STATEMENT
Title Orientation of single crystals by back-reflection Laue pattern simulation /
Statement of responsibility, etc C. Marín & E. Diéguez.
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc Singapore ;
-- River Edge, N.J. :
Name of publisher, distributor, etc World Scientific,
Date of publication, distribution, etc ©1999.
300 ## - PHYSICAL DESCRIPTION
Extent 1 online resource (xiii, 164 pages) :
Other physical details illustrations
336 ## -
-- text
-- txt
-- rdacontent
337 ## -
-- computer
-- c
-- rdamedia
338 ## -
-- online resource
-- cr
-- rdacarrier
500 ## - GENERAL NOTE
General note Some online versions lack accompanying media packaged with the printed version.
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc Includes bibliographical references (pages 159-161) and index.
588 0# -
-- Print version record.
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note NOTE FROM AUTHORS; PREFACE; CONTENTS; CHAPTER 1 X-RAY DIFFRACTION BY CRYSTAL LATTICES; 1.1 Production of X-rays; 1.2 Detection of X-rays; 1.3 Crystal geometry; 1.3.1 Classification of crystallographic systems; 1.3.2 Miller indices and the reciprocal lattice; 1.4 Scattering by an atom; 1.5 Diffraction by lattices and the Bragg law; CHAPTER 2 BACK-REFLECTION LAUE TECHNIQUE; 2.1 Geometry of the back-reflection Laue technique; 2.2 Applications of the back-reflection Laue technique; 2.3 Factors which determine the diffraction intensities in the back-reflection Laue patterns.
505 8# - FORMATTED CONTENTS NOTE
Formatted contents note 2.3.1 Incident radiation2.3.2 Film detector; 2.3.3 Structure factor (F); 2.3.4 Temperature factor; 2.3.5 Anomalous dispersion; 2.3.6 Polarization factor; 2.3.7 Absorption factor; 2.3.8 Lorentz factor; CHAPTER 3 DEVELOPMENT OF THE COMPUTATIONAL PROCEDURES FOR THE SIMULATION AND INDEXING OF BACK-REFLECTION LAUE PATTERNS; 3.1 Geometrical simulation procedure; 3.2 Estimation of intensities procedure; 3.2.1 Procedure for the estimation of intensities; 3.2.2 Results and comments about the estimation of intensities.
505 8# - FORMATTED CONTENTS NOTE
Formatted contents note 3.2.2.a Comparison between the simulation of back-reflection patterns with and without estimation of intensities3.2.2.b Filtering amd characteristic limes effects; 3.2.2.c Exposure time effects; 3.2.2. d Film detector effects; 3.2.2.e Distinction of anisotropic orientations; 3.3 Indexing method; 3.3.1 Indexing procedure; 3.3.2 Indexing result; 3.3.3 Strategy for the indexing work; CHAPTER 4 PROGRAMMING AND USE OF THE SUPPLIED SOFTWARE; 4.1 Code development; 4.2 Hardware specifications and installation procedure; 4.3 User manual; 4.3.1 Input of the geometrical data; 4.3.2 Selection of the job.
505 8# - FORMATTED CONTENTS NOTE
Formatted contents note 4.3.3 Simulation4.3.4 Indexing; CHAPTER 5 COMPARISON AND DISCUSSION BETWEEN SIMULATED AND EXPERIMENTAL PATTERNS OF SAMPLES OF THE SEVEN CRYSTAL LATTICE; 5.1 Cubic: GaSb; 5.2 Tetragonal: KH2PO4; 5.3 Orthorhombic: KTiOPO4; 5.4 Monoclinic: (CH2NH2COOH)3H2SO4; 5.5 Hexagonal: ZnO; 5.6 Rhombohedral: LiNbO3; 5.7 Triclinic: Na2W4O13; APPENDICES; A1 The 230 Space Groups; A2 Crystal structures data; LIST OF SYMBOLS; REFERENCES; SUBJECT INDEX.
520 ## - SUMMARY, ETC.
Summary, etc Laue-grams are the easiest X-ray diffraction patterns that can be obtained and are very useful for orienting single crystals and finding out the symmetry of a projection. Despite the simplicity of the experimental equipment, the orientation work is a costly and time consuming process. It would be a great advantage to be able to simulate any kind of Laue-gram and to identify an unknown crystal orientation, including anisotropic ones. This book presents the complete numerical algorithms for simulation of X-ray back-reflection Laue-grams by evaluating the main factors that affect the intensities o.
590 ## - LOCAL NOTE (RLIN)
Local note eBooks on EBSCOhost
Provenance (VM) [OBSOLETE] EBSCO eBook Subscription Academic Collection - Worldwide
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element X-ray crystallography.
9 (RLIN) 163987
650 #2 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Crystallography, X-Ray
9 (RLIN) 944526
650 #6 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Radiocristallographie.
9 (RLIN) 944527
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element SCIENCE
General subdivision Physics
-- Crystallography.
Source of heading or term bisacsh
9 (RLIN) 868778
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element X-ray crystallography.
Source of heading or term fast
-- (OCoLC)fst01181820
9 (RLIN) 163987
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Computersimulation
Source of heading or term gnd
9 (RLIN) 907688
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Kristallorientierung
Source of heading or term gnd
9 (RLIN) 944528
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Laue-Diagramm
Source of heading or term gnd
9 (RLIN) 944529
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Laue-Verfahren
Source of heading or term gnd
9 (RLIN) 944530
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Röntgenstrukturanalyse
Source of heading or term gnd
9 (RLIN) 944531
655 #4 - INDEX TERM--GENRE/FORM
Genre/form data or focus term Electronic books.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Diéguez, E.
Fuller form of name (Ernesto)
9 (RLIN) 944532
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Print version:
Main entry heading Marín, C. (Carlos), 1970-
Title Orientation of single crystals by back-reflection Laue pattern simulation.
Place, publisher, and date of publication Singapore ; River Edge, N.J. : World Scientific, ©1999
International Standard Book Number 9810228716
Record control number (DLC) 98054444
-- (OCoLC)40545400
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=564355">https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=564355</a>
938 ## -
-- Askews and Holts Library Services
-- ASKH
-- AH25589438
938 ## -
-- ProQuest Ebook Central
-- EBLB
-- EBL1223695
938 ## -
-- ebrary
-- EBRY
-- ebr10698988
938 ## -
-- EBSCOhost
-- EBSC
-- 564355
938 ## -
-- ProQuest MyiLibrary Digital eBook Collection
-- IDEB
-- cis26007342
938 ## -
-- YBP Library Services
-- YANK
-- 10584750
994 ## -
-- 92
-- INOPJ
Holdings
Withdrawn status Lost status Damaged status Not for loan Collection code Home library Current library Date acquired Total Checkouts Date last seen Price effective from Koha item type
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