Normal view MARC view ISBD view

Metrology and fundamental constants = Metrologia e costanti fondamentali : Varenna on Lake Como, Villa Monastero, 18-28 July 2006 / Metrologia e costanti fondamentali edited by T.W. Hänsch [and others]. - Amsterdam ; Washington, DC : Bologna, Italy : Ios Press ; Società italiana di fisica, 2007. - 1 online resource (xxii, 649 pages) : illustrations. - Proceedings of the International School of Physics "Enrico Fermi" ; course 166 . - International School of Physics "Enrico Fermi." Proceedings of the International School of Physics "Enrico Fermi" ; course 166. .

Includes bibliographical references.

ISBN: 9781435677814 (electronic bk.) 1435677811 (electronic bk.) (SIF) (IOS) (SIF)

Subjects--Topical Terms:
Metrology--Congresses.
Physical measurements--Congresses.
Standardization--Congresses.
Physical constants--Congresses.
Métrologie--Congrès.
Mesures physiques--Congrès.
Normalisation--Congrès.
Constantes physiques--Congrès.
TECHNOLOGY & ENGINEERING--Measurement.
MATHEMATICS--Measurement.
Metrology.
Physical constants.
Physical measurements.
Standardization.

Index Terms--Genre/Form:
Electronic books.
Electronic books.
Conference papers and proceedings.

LC Class. No.: QA465 / .I558 2006eb

Dewey Class. No.: 530.8